• DocumentCode
    598359
  • Title

    An influence factor of high reliable thermosonic au wire-bonding

  • Author

    Bin Wang ; Xiu-ying Mo ; Hong-Wei Li

  • Author_Institution
    Sci. & Technol. on Electron. Test & Meas. Lab., Qingdao, China
  • fYear
    2012
  • fDate
    Oct. 29 2012-Nov. 1 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Thermosonic bonding has been found to be a promising process in microelectronic packaging industry. It provides electrical interconnects between semi-conductor, hybrid, or microwave devices. Gold wire wedge bonding has been widely used in microwave communications and surveillance projects for its nicer high frequency characteristics. In this thesis, the roughness of the bonding tools tip as one of the factors which influence the bonding quality was presented. The mechanism and the results of experimentation were introduced in detail.
  • Keywords
    gold; integrated circuit interconnections; tape automated bonding; bonding quality; bonding tools tip; electrical interconnects; frequency characteristics; gold wire wedge bonding; hybrid device; influence factor; microelectronic packaging industry; microwave communications; microwave device; semiconductor device; surveillance projects; thermosonic gold wire-bonding; Acoustics; Bonding; Force; Gold; Rough surfaces; Surface roughness; Wires; bonding quality; influence factor; roughness; wire bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4673-2474-8
  • Type

    conf

  • DOI
    10.1109/ICSICT.2012.6467732
  • Filename
    6467732