DocumentCode
598359
Title
An influence factor of high reliable thermosonic au wire-bonding
Author
Bin Wang ; Xiu-ying Mo ; Hong-Wei Li
Author_Institution
Sci. & Technol. on Electron. Test & Meas. Lab., Qingdao, China
fYear
2012
fDate
Oct. 29 2012-Nov. 1 2012
Firstpage
1
Lastpage
3
Abstract
Thermosonic bonding has been found to be a promising process in microelectronic packaging industry. It provides electrical interconnects between semi-conductor, hybrid, or microwave devices. Gold wire wedge bonding has been widely used in microwave communications and surveillance projects for its nicer high frequency characteristics. In this thesis, the roughness of the bonding tools tip as one of the factors which influence the bonding quality was presented. The mechanism and the results of experimentation were introduced in detail.
Keywords
gold; integrated circuit interconnections; tape automated bonding; bonding quality; bonding tools tip; electrical interconnects; frequency characteristics; gold wire wedge bonding; hybrid device; influence factor; microelectronic packaging industry; microwave communications; microwave device; semiconductor device; surveillance projects; thermosonic gold wire-bonding; Acoustics; Bonding; Force; Gold; Rough surfaces; Surface roughness; Wires; bonding quality; influence factor; roughness; wire bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4673-2474-8
Type
conf
DOI
10.1109/ICSICT.2012.6467732
Filename
6467732
Link To Document