• DocumentCode
    598738
  • Title

    (Invited) Challenges in Engineering RRAM technology for high density applications

  • Author

    Ramaswamy, Nirmal

  • Author_Institution
    Emerging Memory Group, Micron Technology
  • fYear
    2012
  • fDate
    14-18 Oct. 2012
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. Although RRAM technology shows significant potential to be a major component of future memory systems, significant challenges exist for high density RRAM applications. Some of these critical challenges such as read noise, retention, endurance and tail bit performance will be discussed.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IRW), 2012 IEEE International
  • Conference_Location
    South Lake Tahoe, CA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4673-2749-7
  • Type

    conf

  • DOI
    10.1109/IIRW.2012.6468902
  • Filename
    6468902
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=598738