• DocumentCode
    599516
  • Title

    Particle swarm optimization for the identification of worst case test vectors of total-dose induced leakage current failures in ASICs

  • Author

    Abdel-Aziz, M.M. ; Abdel-Aziz, H.A. ; Abou-Auf, A.A. ; Wassal, A.G.

  • Author_Institution
    Electronics Engineering Dept., American University in Cairo, AUC Avenue, P.O. Box 74, New Cairo, 11835, Egypt
  • fYear
    2012
  • fDate
    16-20 Dec. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We develop a methodology for identifying worst-case test vectors necessary to detect leakage current failures in standard-cell based ASIC devices exposed to a total ionizing dose. We developed a novel search methodology based on the Particle Swarm Optimization technique.
  • Keywords
    CMOS; PSO; Particle Swarm Optimization; leakage current; test vectors; total dose; worst-case;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (ICM), 2012 24th International Conference on
  • Conference_Location
    Algiers, Algeria
  • Print_ISBN
    978-1-4673-5289-5
  • Type

    conf

  • DOI
    10.1109/ICM.2012.6471379
  • Filename
    6471379
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=599516