• DocumentCode
    600854
  • Title

    Susceptibility of Electro-Explosive Devices to high pulsed electric fields

  • Author

    Reale, David V. ; Mankowski, J. ; Dickens, J.

  • Author_Institution
    Center for Pulsed Power & Power Electron., Texas Tech Univ., Lubbock, TX, USA
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    211
  • Lastpage
    214
  • Abstract
    Commercially available Electro-Explosive Devices (EEDs), such as blasting caps, use electrical current to initiate a primary charge. Various detonators including bridge wire, match-type, exploding bridge wire, and slapper. The basic operating principle of the match-type device is to heat the ignition element to the ignition temperature of the primary explosive. The normal operation current profiles, both constant current and pulsed excitation, are well known, as is the ignition temperature. However, as safety and reliability are of great concern, both in the operation and storage of EEDs, the susceptibility of these devices to transient or spurious fields is of interest. The susceptibility of match-type EEDs to high pulsed electric fields is examined. A Finite Element Method (FEM) simulation is performed using COMSOL to determine the induced current in the bridgewire due to applied electric fields and the resulting Joule heating of the wire. Several situations are investigated including the EED in conductive and non-conductive media and leads open or terminated representing operational and storage conditions.
  • Keywords
    electric fields; finite element analysis; COMSOL; EED; FEM simulation; Joule heating; blasting caps; bridge wire; conductive media; constant current; detonators; electrical current; electro-explosive devices susceptibility; finite element method simulation; high pulsed electric fields; ignition element; ignition temperature; induced current; match-type device; nonconductive media; normal operation current profiles; primary charge; primary explosive; pulsed excitation; slapper; spurious fields; storage conditions; transient fields; Electromagnetic coupling; Electromagnetic transients; Finite element methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Modulator and High Voltage Conference (IPMHVC), 2012 IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    978-1-4673-1222-6
  • Type

    conf

  • DOI
    10.1109/IPMHVC.2012.6518716
  • Filename
    6518716