• DocumentCode
    601817
  • Title

    The impact of high-voltage and fast-switching devices on modular multilevel converters

  • Author

    Guzman P, D.A. ; Balda, Juan Carlos

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    2171
  • Lastpage
    2177
  • Abstract
    US government is funding the development of high-voltage and fast-switching power semiconductor devices based on silicon carbide (SiC) for applications in medium- and high-voltage power systems. The availability of these devices should reduce the complexities of grid-connected advanced power electronic systems like medium-voltage voltage-source converters (VSC) for HVDC terminals, power electronic interfaces for distributed generation, or high-power motor drives. However, fast-switching devices may augment the adverse effects of parasitic inductances that are inherent in any power converter layout. Hence, this paper presents a theoretical analysis of the impacts that the developing 15-kV SiC insulated gate bipolar transistors (IGBTs) have on modular multilevel converters (MMCs) in terms of the sub-module (SM) numbers, the SM capacitance, the effects of parasitic inductances on overvoltages, capacitor and IGBT module volumes, and THD. An 800 MW ±320 kV VSC-HVDC terminal is selected as a case study to illustrate the potential advantages of such a high-voltage and fast-switching semiconductor device.
  • Keywords
    high-voltage engineering; insulated gate bipolar transistors; power semiconductor devices; silicon compounds; adverse effects; fast-switching semiconductor device; grid-connected advanced power electronic systems; high-voltage fast-switching devices; high-voltage semiconductor device; insulated gate bipolar transistors; modular multilevel converters; potential advantages; power electronic interfaces; power semiconductor devices; silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520596
  • Filename
    6520596