• DocumentCode
    602775
  • Title

    Modeling and experiment on low voltage slow-light electro-absorption modulators for high-speed and low power consumption optical interconnect

  • Author

    Shimizu, Shogo ; Xiadong Gu ; Shimada, Toshikazu ; Matsutani, Akihiro ; Koyama, Fumio

  • Author_Institution
    Photonics Integration Syst. Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2012
  • fDate
    10-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Optical interconnects offer significant advantages for future high performance computers and large scale data centers. The development of low-voltage and high-speed modulators would be a challenge for further increase of the link capacity with low power consumption. we present the modeling and the experiment toward ultra-low voltage (<;500mV) and small footprint (<;50mV) electro-absorption modulators. We fabricated Bragg reflector waveguide slow light modulators with GaInAs/GaAs QW electro-absorption. We present the modeling and the measurement on their static characteristics including their near-field patterns with different applied voltages. While extinction ratios are lower than the modeling, sub-volt modulation can be seen for miniature devices below 100μm. In addition, we calculated the power consumption by simple circuit of modulator. As a result, a possibility of low power consumption below 100fJ/bit is presented.
  • Keywords
    III-V semiconductors; electro-optical modulation; electroabsorption; gallium arsenide; indium compounds; optical fabrication; optical interconnections; optical waveguides; semiconductor quantum wells; slow light; Bragg reflector waveguide; GaInAs-GaAs; extinction ratio; high performance computers; large scale data centers; link capacity; low power consumption; low voltage slow-light electro-absorption modulators; near-field patterns; optical interconnect; semiconductor quantum wells; slow light modulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan, 2012 2nd IEEE
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-2654-4
  • Type

    conf

  • DOI
    10.1109/ICSJ.2012.6523406
  • Filename
    6523406