• DocumentCode
    602931
  • Title

    Improving timing error tolerance without impact on chip area and power consumption

  • Author

    Yano, Ken´ichi ; Hayashida, T. ; Sato, Takao

  • Author_Institution
    Fukuoka Univ., Fukuoka, Japan
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    373
  • Lastpage
    378
  • Abstract
    The demand of power saving and highly dependable LSI has increased by the miniaturization of device process technology and the spread of portable devices such as mobile phones. The design method which takes the worst case scenario makes the design margin too large because of the parameter variations in the deep submicron domain and it has serious impact for performance and power consumption. To deal with excessive design margins, typical-case design method with canary FF has been proposed so far. By using canary FF, variability-aware large guard band can be decreased. In this paper, we describe how canary FF can be integrated in a typical digital circuit design flow in detail and analyze the area and power overheads compared with the worst-case design method. The analysis is done by implementing two conventional 32-bit RISC processor cores; miniMIPS and MeP (Media Embedded Processor). The results show that our proposed method can reduce chip areas effectively and power overhead can be reduced to very small.
  • Keywords
    digital circuits; large scale integration; microprocessor chips; power consumption; reduced instruction set computing; LSI; MeP; RISC processor cores; canary FF; digital circuit design flow; impact on chip; media embedded processor; miniMIPS; portable devices; power consumption; power saving; timing error tolerance; typical-case design method; Clocks; Delays; Design methodology; Educational institutions; Libraries; Synchronization; canary flip-flops; process and environmental variations; timing error detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523638
  • Filename
    6523638