DocumentCode
602961
Title
Stochastic behavioral modeling of analog/mixed-signal circuits by maximizing entropy
Author
Krishnan, Ram ; Wei Wu ; Fang Gong ; Lei He
Author_Institution
Electr. Eng., Univ. of California, Los Angeles, Los Angeles, CA, USA
fYear
2013
fDate
4-6 March 2013
Firstpage
572
Lastpage
579
Abstract
Maximum entropy (MAXENT) is a powerful and flexible method for estimating the arbitrary probabilistic distribution of a stochastic variable with moment constraints. However, modeling the stochastic behavior of analog/mixed-signal (AMS) circuits using MAXENT is still unknown. In this paper, we present a MAXENT based approach to efficiently model the arbitrary behavioral distribution of AMS circuits with high accuracy. The exact behavioral distribution can be approximated by a product of exponential functions with different Lagrangian multipliers. The closest approximation can be obtained by maximizing Shannon´s information entropy subject to moment constraints, leading to a nonlinear system. Classic Newton´s method is used to solve the nonlinear system for the Lagrangian multipliers, which can further recover the arbitrary behavioral distribution of AMS circuits. Extensive experiments on different circuits demonstrate that the proposed MAXENT based approach offers better stability and improves the accuracy up to 110% when compared to previous AWE-based moment matching approaches, and offers up to 592x speedup when compared to Monte Carlo method.
Keywords
Newton method; approximation theory; digital signal processing chips; exponential distribution; maximum entropy methods; mixed analogue-digital integrated circuits; AMS circuits; AWE-based moment matching approach; Lagrangian multipliers; MAXENT-based approach; Shannon information entropy; analog-mixed-signal circuits; behavioral distribution; classic Newton method; closest approximation; exponential functions; maximum entropy; moment constraints; nonlinear system; probabilistic distribution; stochastic behavioral modeling; Circuit optimization; Entropy; Integrated circuit modeling; Probabilistic logic; Random access memory; Stochastic processes; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-4673-4951-2
Type
conf
DOI
10.1109/ISQED.2013.6523668
Filename
6523668
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