• DocumentCode
    602961
  • Title

    Stochastic behavioral modeling of analog/mixed-signal circuits by maximizing entropy

  • Author

    Krishnan, Ram ; Wei Wu ; Fang Gong ; Lei He

  • Author_Institution
    Electr. Eng., Univ. of California, Los Angeles, Los Angeles, CA, USA
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    572
  • Lastpage
    579
  • Abstract
    Maximum entropy (MAXENT) is a powerful and flexible method for estimating the arbitrary probabilistic distribution of a stochastic variable with moment constraints. However, modeling the stochastic behavior of analog/mixed-signal (AMS) circuits using MAXENT is still unknown. In this paper, we present a MAXENT based approach to efficiently model the arbitrary behavioral distribution of AMS circuits with high accuracy. The exact behavioral distribution can be approximated by a product of exponential functions with different Lagrangian multipliers. The closest approximation can be obtained by maximizing Shannon´s information entropy subject to moment constraints, leading to a nonlinear system. Classic Newton´s method is used to solve the nonlinear system for the Lagrangian multipliers, which can further recover the arbitrary behavioral distribution of AMS circuits. Extensive experiments on different circuits demonstrate that the proposed MAXENT based approach offers better stability and improves the accuracy up to 110% when compared to previous AWE-based moment matching approaches, and offers up to 592x speedup when compared to Monte Carlo method.
  • Keywords
    Newton method; approximation theory; digital signal processing chips; exponential distribution; maximum entropy methods; mixed analogue-digital integrated circuits; AMS circuits; AWE-based moment matching approach; Lagrangian multipliers; MAXENT-based approach; Shannon information entropy; analog-mixed-signal circuits; behavioral distribution; classic Newton method; closest approximation; exponential functions; maximum entropy; moment constraints; nonlinear system; probabilistic distribution; stochastic behavioral modeling; Circuit optimization; Entropy; Integrated circuit modeling; Probabilistic logic; Random access memory; Stochastic processes; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523668
  • Filename
    6523668