• DocumentCode
    611135
  • Title

    MTBF Bounds for Multistage Synchronizers

  • Author

    Beer, Sebastian ; Cox, Jerome ; Chaney, Tom ; Zar, David M.

  • Author_Institution
    EE Dept., Technion - Israel Inst. of Technol., Haifa, Israel
  • fYear
    2013
  • fDate
    19-22 May 2013
  • Firstpage
    158
  • Lastpage
    165
  • Abstract
    Synchronizers are used to mitigate the effects of metastability in multiple clock domain System-on-Chip devices. In order to enable reliable synchronization, the synchronizer MTBF (Mean Time Between Failures) should be much longer than the product lifetime. To achieve such high margins, multistage synchronizers are used. Several simulation methods have been developed to determine their probability of failure and the number of stages to use. While simulation methods have improved in recent years, accurate analytical models for failure calculations are scant. Some previously published models do not reflect estimations of MTBF but only loose lower bounds that give rise to a high number of synchronizer stages reducing the overall system performance. Others provide improved accuracy but are difficult to operate and simulation for each stage is required. In this paper, we review published analytical models for MTBF calculations of multistage synchronizers. We show that existing models often underestimate MTBF, and in some cases they even overestimate it. A new model that calculates a MTBF lower bound with significantly smaller margins is introduced. These estimates are shown to be consistent with state of the art simulations and measurements. A method for calculating these estimates for a variety of applications is presented based on a limited number of intrinsic synchronizer parameters determined by simulation.
  • Keywords
    circuit stability; clocks; failure analysis; integrated circuit reliability; probability; system-on-chip; MTBF bounds; intrinsic synchronizer parameters; mean time between failures; metastability effect; multiple clock domain system-on-chip devices; multistage synchronizers; probability of failure; product lifetime; Synchronization; mean time between failures (MTBF); metastability; multi-stage synchronizers; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asynchronous Circuits and Systems (ASYNC), 2013 IEEE 19th International Symposium on
  • Conference_Location
    Santa Monica, CA
  • ISSN
    1522-8681
  • Print_ISBN
    978-1-4673-5956-6
  • Type

    conf

  • DOI
    10.1109/ASYNC.2013.18
  • Filename
    6546190