Characterization of 60 GHz proximity desktop channels with electronic device chassis

Measurements of 60 GHz proximity desktop channels considering the influence of electronic device chassis are performed and the results are characterized by using a statistical channel model. In the measured channels, conventional exponential decay profiles that have a relatively large first path are observed due to reflections inside the devices. We also show that the power difference between the first path and the delay paths is related to randomization of radio wave polarization by reflections inside the devices, whereas this is conventionally dependent on only a Rice factor. To express the effect, the conventional model is modified by adding a parameter. Computer simulations confirm that RMS delay spreads of the modeled channels are a good fit to those of the measured ones.