• DocumentCode
    613029
  • Title

    Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling

  • Author

    Moon, Thomas ; Hyun Woo Choi ; Chatterjee, Avhishek

  • Author_Institution
    Sch. of ECE, Georgia Tech, Atlanta, GA, USA
  • fYear
    2013
  • fDate
    April 29 2013-May 2 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a new method to reconstruct signal by a monobit receiver based on incoherent subsampling. The proposed method uses a time-variant threshold voltage for the monobit receiver to increase its amplitude resolution. By our methodology, the threshold voltage does not have to be synchronized with the input signal nor the sampling clock of the system. Hardware measurement with FPGA and high-bandwidth clocked-comparators shows that a low-cost multi-channel test is achievable by our method. The hardware measurement results show a square waveform and a sine wave waveform reconstruction.
  • Keywords
    clocks; comparators (circuits); field programmable gate arrays; integrated circuit testing; signal reconstruction; FPGA; amplitude resolution; hardware measurement; high-bandwidth clocked-comparators; incoherent subsampling; low-cost multichannel testing; monobit receivers; periodic signals; signal reconstruction; sine wave waveform reconstruction; square waveform; time-variant threshold voltage; Clocks; Hardware; Receivers; Signal reconstruction; Signal resolution; Synchronization; Testing; Monobit receiver; analog-to-digital conversion; frequency estimation; incoherent subsampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2013 IEEE 31st
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-5542-1
  • Type

    conf

  • DOI
    10.1109/VTS.2013.6548934
  • Filename
    6548934