DocumentCode
613550
Title
Enhanced fault-tolerant Network-on-Chip architecture using hierarchical agents
Author
Valinataj, M. ; Liljeberg, Pasi ; Plosila, Juha
Author_Institution
Sch. of Electr. & Comput. Eng., Babol Univ. of Technol., Babol, Iran
fYear
2013
fDate
8-10 April 2013
Firstpage
141
Lastpage
146
Abstract
The reliability is a vital aspect in the design of Network-on-Chip (NoC) based systems because a fault in communication medium may cause an overall system failure. On the other hand, performance degradation is an inescapable consequence of fault-tolerant architectures. In this paper, we propose a fault-tolerant NoC architecture that attains higher performance by using low cost agents in a hierarchical manner. These agents which are distributed all over the network, collect, process, and distribute different fault information. Moreover, we propose an enhanced fault-tolerant and congestion-aware routing method that exploits the classified fault information related to the permanent faults that might occur inside the links, network interfaces and different parts of the routers. The experimental results reveal that the proposed NoC architecture imposes small area and power overheads.
Keywords
fault tolerance; integrated circuit design; integrated circuit reliability; network routing; network-on-chip; NoC-based system design; classified fault information; enhanced fault-tolerant congestion-aware routing method; enhanced fault-tolerant network-on-chip architecture; fault-tolerant NoC architecture; hierarchical agents; low-cost agents; overall system failure; performance degradation; permanent faults; reliability; Circuit faults; Fault tolerance; Fault tolerant systems; Nickel; Peer-to-peer computing; Ports (Computers); Routing; congestion; fault-tolerance; network-on-chip; permanent fault; reconfiguration; routing algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
Conference_Location
Karlovy Vary
Print_ISBN
978-1-4673-6135-4
Electronic_ISBN
978-1-4673-6134-7
Type
conf
DOI
10.1109/DDECS.2013.6549806
Filename
6549806
Link To Document