• DocumentCode
    613570
  • Title

    Error resilient OBDDs

  • Author

    Bernasconi, Anna ; Ciriani, Valentina ; Lago, L.

  • Author_Institution
    Dept. of Comput. Sci., Univ. di Pisa, Pisa, Italy
  • fYear
    2013
  • fDate
    8-10 April 2013
  • Firstpage
    246
  • Lastpage
    249
  • Abstract
    Ordered Binary Decision Diagrams (OBDDs) are a widely used data structure for Boolean function manipulation. In particular, OBDDs are commonly used in CAD for the synthesis and verification of integrated circuits. The purpose of this paper is to design an error resilient version of this data structure, i.e., self-repairing OBDDs.We describe some strategies that make reduced OBDDs resilient to errors in the indexes, that are associated to the input variables, or in the edges. The solutions we propose allow to efficiently restore via software the corrupt OBDD without changing the data structure, but rather exploiting its inherent redundancy, as well as the redundancy introduced by its efficient implementations.
  • Keywords
    Boolean functions; binary decision diagrams; data structures; Boolean function manipulation; CAD; data structure; error resilient OBDD; integrated circuit synthesis; integrated circuit verification; ordered binary decision diagram; self-repairing OBDD; Benchmark testing; Binary decision diagrams; Boolean functions; Indexes; Reactive power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 IEEE 16th International Symposium on
  • Conference_Location
    Karlovy Vary
  • Print_ISBN
    978-1-4673-6135-4
  • Electronic_ISBN
    978-1-4673-6134-7
  • Type

    conf

  • DOI
    10.1109/DDECS.2013.6549826
  • Filename
    6549826