• DocumentCode
    615623
  • Title

    Comparison between the use of surface and volume conductivity to compute potential distribution along an insulator in presence of a thin conductive layer

  • Author

    Volat, Christophe

  • Author_Institution
    Univ. of Quebec at Chicoutimi, Chicoutimi, QC, Canada
  • fYear
    2013
  • fDate
    2-5 June 2013
  • Firstpage
    409
  • Lastpage
    413
  • Abstract
    This paper describes a comparative study on the modeling of a thin conductive dielectric layer usually found on polluted or ice-covered insulators. Two different approaches such as those offered by most FEM commercial software were studied. The first one is a volume approach which takes into account the thickness of the thin layer. The second is the surface approach where the thin layer is treated as a specific boundary condition. Simulations were performed using the FEM commercial software Comsol Multiphysics® that allows both volume and surface approaches. Parameters such as conductivity and permittivity of the thin layer as well as the number of elements used are studied both in 2D axisymmetric and 3D modeling. The results obtained demonstrated that the surface approach is the best solution as it provides the same results as the volume approach but with 3 times less elements required for the mesh. The surface approach should then be considered for 3D complex problems where thin conductive dielectric layer is present.
  • Keywords
    finite element analysis; insulator contamination; permittivity; surface conductivity; 2D axisymmetric modeling; 3D complex problem; 3D modeling; FEM commercial software Comsol Multiphysics; conductive dielectric layer; ice-covered insulators; insulator; polluted insulators; potential distribution; specific boundary condition; surface approach; surface conductivity; thin-conductive dielectric layer; thin-layer permittivity; thin-layer thickness; volume approach; volume conductivity; Conductivity; Electric potential; Finite element analysis; Insulators; Permittivity; Solid modeling; Surface contamination; FEM; polluted insulator; potential distribution; thin conductive dielectric layer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference (EIC), 2013 IEEE
  • Conference_Location
    Ottawa, ON
  • Print_ISBN
    978-1-4673-4738-9
  • Electronic_ISBN
    978-1-4673-4739-6
  • Type

    conf

  • DOI
    10.1109/EIC.2013.6554278
  • Filename
    6554278