• DocumentCode
    616530
  • Title

    Coverage overlapping problems in applications of IEEE 802.15.4 wireless sensor networks

  • Author

    Chao Ma ; Jianhua He ; Chen, Hsiao-hwa ; Zuoyin Tang

  • Author_Institution
    Sch. of Eng. & Appl. Sci., Aston Univ., Birmingham, UK
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    4364
  • Lastpage
    4369
  • Abstract
    IEEE 802.15.4 standard is a relatively new standard designed for low power low data rate wireless sensor networks (WSN), which has a wide range of applications, e.g., environment monitoring, e-health, home and industry automation. In this paper, we investigate the problems of hidden devices in coverage overlapped IEEE 802.15.4 WSNs, which is likely to arise when multiple 802.15.4 WSNs are deployed closely and independently. We consider a typical scenario of two 802.15.4 WSNs with partial coverage overlapping and propose a Markov-chain based analytical model to reveal the performance degradation due to the hidden devices from the coverage overlapping. Impacts of the hidden devices and network sleeping modes on saturated throughput and energy consumption are modeled. The analytic model is verified by simulations, which can provide the insights to network design and planning when multiple 802.15.4 WSNs are deployed closely.
  • Keywords
    IEEE standards; Markov processes; Zigbee; energy consumption; telecommunication network planning; telecommunication network topology; wireless sensor networks; IEEE 802.15.4; Markov-chain based analytical model; WSN; analytic model; coverage overlapping problems; e-health; energy consumption; environment monitoring; home automation; industry automation; network design; network planning; network sleeping modes; wireless sensor networks; Analytical models; Bismuth; Energy consumption; IEEE 802.15 Standards; Performance evaluation; Throughput; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications and Networking Conference (WCNC), 2013 IEEE
  • Conference_Location
    Shanghai
  • ISSN
    1525-3511
  • Print_ISBN
    978-1-4673-5938-2
  • Electronic_ISBN
    1525-3511
  • Type

    conf

  • DOI
    10.1109/WCNC.2013.6555280
  • Filename
    6555280