Sensitivity analysis of a single-port vector reflectometer with a wideband phase-shifter

Author

Kothari, Ankit ; Ghasr, Mohammad Tayeb ; Zoughi, Reza

Author_Institution

Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA

fYear

2013

fDate

6-9 May 2013

Firstpage

381

Lastpage

386

Abstract

Sensitivity analysis is presented for wideband single-port vector reflectometers designed based on a noncoherent detection scheme. Simulations are performed to obtain the sensitivity of the systems to noise associated with the measured standing-wave voltage. The effect of insertion loss in phase-shifter, total phase shift and error in detector characterization on the accuracy of measuring the reflection coefficient of a device under test (DUT) is investigated. Results of this analysis are validated using measurements performed by custom-designed single-port reflectometer systems at X-band (8.2 - 12.4 GHz) and Ka-band (26.5 - 40 GHz).

Keywords

measurement errors; microwave phase shifters; microwave reflectometry; millimetre wave phase shifters; network analysers; reflectometers; voltage measurement; Ka-band; X-band; device under test; frequency 26.5 GHz to 40 GHz; frequency 8.2 GHz to 12.4 GHz; insertion loss; measurement error; measurement noise; noncoherent detection scheme; reflection coefficient measurement; sensitivity analysis; standing wave voltage measurement; wideband phase shifter; wideband single port vector reflectometer; Detectors; Mathematical model; Reflection coefficient; Signal to noise ratio; Transmission line measurements; Voltage measurement; electronic phase-shifter; insertion loss; microwave; millimeter-wave; sensitivity analysis; vector reflectometry;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2013 IEEE International

Conference_Location

Minneapolis, MN

ISSN

1091-5281

Print_ISBN

978-1-4673-4621-4

Type

conf

DOI

10.1109/I2MTC.2013.6555444

Filename

6555444