• DocumentCode
    617200
  • Title

    Hardware implementations and performance assessments of a DC magnetron sputter for enhanced depositions

  • Author

    Cheng-Tsung Liu ; Chih-Wen Chang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    2013
  • fDate
    12-15 May 2013
  • Firstpage
    1477
  • Lastpage
    1481
  • Abstract
    To refine the substrate deposition results, some supplementary mechanical adjustments can be designed and implemented onto the existing DC magnetron sputters (MS). By the assistances of these attachments along with proper controls on the magnetic and electric field paths inside the vacuum chamber, results indicated that more target atoms can be sputtered and smoother depositions on the substrate surface can be achieved. Based on appropriate performance index selections, operations of the DC MS were thoroughly investigated. Selected regions on the deposited substrate surface will be probed with thickness gauge and atomic force microscopy, thus the operational performances of the DC MS with structural refinements can be assessed and the desired improvements can then be systematically validated.
  • Keywords
    atomic force microscopy; electric field effects; magnetic field effects; sputter deposition; DC magnetron sputter; atomic force microscopy; electric field path; enhanced depositions; hardware implementations; magnetic field path; performance assessments; performance index selections; proper controls; structural refinements; substrate deposition; substrate surface; supplementary mechanical adjustments; thickness gauge; vacuum chamber; Magnetic flux; Plasma measurements; Plasmas; Sputtering; Substrates; Surface treatment; Thickness measurement; Permanent magnet; magnetron sputter; operational trajectory; substrate deposition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Machines & Drives Conference (IEMDC), 2013 IEEE International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4673-4975-8
  • Electronic_ISBN
    978-1-4673-4973-4
  • Type

    conf

  • DOI
    10.1109/IEMDC.2013.6556338
  • Filename
    6556338