Prediction of stochastic eye diagrams via IC equivalents and Lagrange polynomials

Author

Manfredi, Paolo ; Stievano, Igor Simone ; Canavero, Flavio G.

Author_Institution

Dipt. di Elettron. e Telecomun., Politec. di Torino, Turin, Italy

fYear

2013

fDate

12-15 May 2013

Firstpage

1

Lastpage

4

Abstract

This paper addresses the prediction of eye diagrams in high-speed data links with the inclusion of manufacturing tolerances. The statistical assessment of the system performance is done via the combined application of accurate and efficient IC models and of the stochastic collocation method with Lagrange interpolating polynomials. Numerical results on the computation of the eye opening profile for a realistic PCB interconnect with the inclusion of the effects of parameters uncertainties conclude the paper.

Keywords

integrated circuit modelling; interpolation; printed circuit interconnections; statistical analysis; IC equivalent; IC model; Lagrange interpolating polynomials; PCB interconnect; high-speed data links; manufacturing tolerances; parameters uncertainty; statistical assessment; stochastic collocation method; stochastic eye diagram prediction; Computational modeling; Integrated circuit interconnections; Integrated circuit modeling; Interpolation; Polynomials; Ports (Computers);

fLanguage

English

Publisher

ieee

Conference_Titel

Signal and Power Integrity (SPI), 2013 17th IEEE Workshop on

Conference_Location

Paris

Print_ISBN

978-1-4673-5678-7

Type

conf

DOI

10.1109/SaPIW.2013.6558335

Filename

6558335