• DocumentCode
    618959
  • Title

    A Si-Glass based pressure sensor with a single piezoresistive element for harsh environment applications

  • Author

    Hong Zhang ; Huiming Xu ; Yan Li ; Zijun Song ; Haisheng San ; Yuxi Yu

  • Author_Institution
    Sch. of Phys. & Mech. & Electr. Eng., Xiamen Univ., Xiamen, China
  • fYear
    2013
  • fDate
    7-10 April 2013
  • Firstpage
    348
  • Lastpage
    351
  • Abstract
    A Si-Glass based MEMS piezoresistive pressure sensor is designed for harsh environment applications, such as vibration, shock and environment conditions with humidity, alkalescence or acidity, electrostatic particles and so on. The sensor chips were fabricated using SOI wafer-glass anodic bonding technology, which enables a single boron-implanted piezoresistor to be on lower surface of silicon diaphragm and be vacuum-sealed in glass cavity. The sensing signals were led out by using the embedded Al electrode structure at the bonding interface of Si-glass to connect single piezoresistor, and two large-area Ni-Au pads are used to electrically connect to the print circuit board (PCB) by using the drag soldering technology instead of gold wire bonding. The characteristics of voltage-pressure were measured with constant current under different temperature conditions. A temperature compensation technology is used to calibrate the measured results, by which the sensitivity of 116 mV/ (mA·MPa) and accuracy of 5.8% F.S. are obtained.
  • Keywords
    aluminium; calibration; compensation; diaphragms; electrochemical electrodes; elemental semiconductors; glass; microfabrication; microsensors; piezoresistive devices; pressure sensors; printed circuits; silicon; silicon compounds; silicon-on-insulator; soldering; wafer bonding; MEMS piezoresistive pressure sensor; Ni-Au; PCB; SOI; Si-Al-SiO2; bonding interface; boron implanted piezoresistor; calibration; drag soldering technology; embedded Al electrode structure; glass cavity; harsh environment; printed circuit board; sensor chip fabrication; silicon diaphragm; temperature compensation technology; vacuum seal; voltage pressure measurement; wafer glass anodic bonding technology; Bonding; Micromechanical devices; Piezoresistance; Silicon; Temperature; Temperature measurement; Temperature sensors; MEMS; anodic bonding; harsh environments; piezoresistive pressure sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2013 8th IEEE International Conference on
  • Conference_Location
    Suzhou
  • Electronic_ISBN
    978-1-4673-6351-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2013.6559748
  • Filename
    6559748