• DocumentCode
    619539
  • Title

    Power benefit study for ultra-high density transistor-level monolithic 3D ICs

  • Author

    Young-Joon Lee ; Limbrick, Daniel ; Sung Kyu Lim

  • Author_Institution
    Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2013
  • fDate
    May 29 2013-June 7 2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The nano-scale 3D interconnects available in monolithic 3D IC technology enable ultra-high density device integration at the individual transistor-level. In this paper we demonstrate the power benefits of transistor-level monolithic 3D designs. We first build a cell library that consists of 3D gates and model their timing/power characteristics. Next, we build timing-closed, full-chip GDSII layouts and perform sign-off iso-performance power comparisons with 2D IC designs. We also study the characteristics of benchmark circuits that maximize the power benefits in monolithic 3D designs. Lastly, our study is extended to predict the power benefits of monolithic 3D designs built with future devices.
  • Keywords
    MOSFET; integrated circuit design; integrated circuit interconnections; integrated circuit layout; nanoelectronics; three-dimensional integrated circuits; 2D IC designs; 3D gates; NMOS transistors; PMOS transistors; full-chip GDSII layouts; individual transistor-level; nanoscale 3D interconnects; power benefit study; sign-off iso-performance; timing-power characteristics; transistor-level monolithic 3D designs; ultrahigh density device integration; ultrahigh density transistor-level monolithic 3D IC technology; Capacitance; Layout; Libraries; Metals; Timing; Transistors; Wires; 3D IC; monolithic 3D; power analysis; transistor-level;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    0738-100X
  • Type

    conf

  • Filename
    6560697