DocumentCode
619539
Title
Power benefit study for ultra-high density transistor-level monolithic 3D ICs
Author
Young-Joon Lee ; Limbrick, Daniel ; Sung Kyu Lim
Author_Institution
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2013
fDate
May 29 2013-June 7 2013
Firstpage
1
Lastpage
10
Abstract
The nano-scale 3D interconnects available in monolithic 3D IC technology enable ultra-high density device integration at the individual transistor-level. In this paper we demonstrate the power benefits of transistor-level monolithic 3D designs. We first build a cell library that consists of 3D gates and model their timing/power characteristics. Next, we build timing-closed, full-chip GDSII layouts and perform sign-off iso-performance power comparisons with 2D IC designs. We also study the characteristics of benchmark circuits that maximize the power benefits in monolithic 3D designs. Lastly, our study is extended to predict the power benefits of monolithic 3D designs built with future devices.
Keywords
MOSFET; integrated circuit design; integrated circuit interconnections; integrated circuit layout; nanoelectronics; three-dimensional integrated circuits; 2D IC designs; 3D gates; NMOS transistors; PMOS transistors; full-chip GDSII layouts; individual transistor-level; nanoscale 3D interconnects; power benefit study; sign-off iso-performance; timing-power characteristics; transistor-level monolithic 3D designs; ultrahigh density device integration; ultrahigh density transistor-level monolithic 3D IC technology; Capacitance; Layout; Libraries; Metals; Timing; Transistors; Wires; 3D IC; monolithic 3D; power analysis; transistor-level;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2013 50th ACM/EDAC/IEEE
Conference_Location
Austin, TX
ISSN
0738-100X
Type
conf
Filename
6560697
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