DocumentCode
626373
Title
A Study in Prioritization for Higher Strength Combinatorial Testing
Author
Xiao Qu ; Cohen, Morris B.
Author_Institution
Corp. Res., Ind. Software Syst. Dept., ABB, Raleigh, NC, USA
fYear
2013
fDate
18-22 March 2013
Firstpage
285
Lastpage
294
Abstract
Recent studies have shown that combinatorial interaction testing (CIT) is an effective fault detection technique and that early fault detection can be improved by ordering test suites by interaction based prioritization approaches. Despite research that has shown that higher strength CIT improves fault detection, there have been fewer studies that aim to understand the impact of prioritization based on higher strength criteria. In this paper, we aim to understand how interaction based prioritization techniques perform, in terms of early fault detection when we prioritize based on 3-way interactions. We generalize prior work on prioritizing using 2-way interactions to t-way prioritization, and empirically evaluate this on three open source subjects, across multiple versions of each. We examine techniques that prioritize both existing CIT suites as well as generate new ones in prioritized order. We find that early fault detection can be improved when prioritizing 3-way CIT test suites by interactions that cover more code, and to a lesser degree when generating tests in prioritized order. Our techniques that work only from the specification, appear to work best with 2-way generation.
Keywords
formal specification; program testing; software fault tolerance; 2-way interaction; 3-way CIT test suite; 3-way interaction; CIT suite; combinatorial interaction testing; fault detection; interaction based prioritization approach; prioritized order; specification; strength criteria; t-way prioritization; test generation; Conferences; Fault detection; Flexible printed circuits; Measurement; Software; Software testing; combinatorial interaction testing; test prioritization; testing strength;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
Conference_Location
Luxembourg
Print_ISBN
978-1-4799-1324-4
Type
conf
DOI
10.1109/ICSTW.2013.40
Filename
6571645
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