• DocumentCode
    626526
  • Title

    Enabling Near-Threshold Voltage(NTV) operation in Multi-VDD cache for power reduction

  • Author

    Yinhe Han ; Ying Wang ; Huawei Li ; Xiaowei Li

  • Author_Institution
    State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    337
  • Lastpage
    340
  • Abstract
    Power constraint for modern processors becomes a very serious problem with the increasing core counts and cache capacity in multi/many core processors. Compared with processing cores with mature techniques like DVFS to alleviate the situation, last level cache which consume largest portion of processor chip needs effective power management strategy. In this paper, we explore the feasibility of Near-Threshold Voltage(NTV) SRAM and Multi-Voltage Domain (Multi-VDD) for power reduction in large capacity cache. To prevent data corruption in cache, we propose redundancy-based data salvaging technique for fault recovery. To solve the dilemma of power reduction and reliability guarantee, we try to match vulnerable/invulnerable data sets to high/low voltage domains. Different from previous work, we take into consideration multi-bit errors and redundancy masking effects in Multi-VDD cache. Experimental results show that our Multi-VDD cache achieves considerable improvements in energy efficiency.
  • Keywords
    SRAM chips; cache storage; integrated circuit reliability; DVFS; NTV SRAM; cache capacity; data corruption; energy efficiency; fault recovery; high-low voltage domains; last level cache; multiVDD cache; multimany core processors; multivoltage domain cache; near-threshold voltage operation SRAM; power constraint; power management strategy; power reduction; processor chip; redundancy masking effects; redundancy-based data salvaging technique; reliability guarantee; vulnerable-invulnerable data sets; Error correction codes; Low voltage; Power demand; Program processors; Random access memory; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6571849
  • Filename
    6571849