• DocumentCode
    628421
  • Title

    Effective voiding control of QFN via solder mask patterning

  • Author

    Herron, Derrick ; Yan Liu ; Ning-Cheng Lee

  • Author_Institution
    Indium Corp., Clinton, NY, USA
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    468
  • Lastpage
    474
  • Abstract
    Voiding under QFNs is a major challenge in the electronics industry. However, voiding can be suppressed by improving venting accessability on the thermal pad by using solder mask dividing strips. Venting accessability is defined as the perimeter length per unit area of the metal pad. Regardless of the shape and the number of subpads, increasing venting accessability results in a decrease in the total number of voids, the largest voids, and discontinuity. Voiding caused by peripheral vias is comparable to voids caused by hidden vias. Voiding increases with decreasing print coverage and is attributed to insufficient solder. Voiding also decreases with an increase in the number of thermal vias. This phenomenon is attributed to volatiles bleeding through the small voids around the thermal via.
  • Keywords
    electronics packaging; soldering; solders; voids (solid); QFN; electronics industry; peripheral vias; quad flat no leads package design; solder mask dividing strips; solder mask patterning; thermal pad; thermal vias; venting accessability; voiding control; volatiles bleeding; Electronic packaging thermal management; Hemorrhaging; Metals; Shape; Soldering; Strips; X-ray imaging; QFN; SMT; Solder joint; lead-free; reflow; solder paste; soldering; thermal pad; venting accessibility; void; voiding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575613
  • Filename
    6575613