• DocumentCode
    628553
  • Title

    An innovative embedded interposer carrier for high density interconnection

  • Author

    Dyi-Chung Hu ; Tzvy-Jang Tseng ; Yu-Hua Chen ; Wei-Chung Lo

  • Author_Institution
    Unimicron Technol. Corp, Hinchu, Taiwan
  • fYear
    2013
  • fDate
    28-31 May 2013
  • Firstpage
    1332
  • Lastpage
    1335
  • Abstract
    It is well known that 3DIC integration is the next generation semiconductor technology with the advantages of small form factor, high performance and low power consumption. However the device TSV process and design rules are not mature. Assembly the chips on top of the Si interposer is the current most desirable method to achieve the requirement of good performance. In this study, a new packaging concept, the Embedded Interposer Carrier (EIC) technology was developed. It aims to solve some of the problems facing current interposer assemble issues. It eliminates the joining process of silicon interposer to the laminate carrier substrate. The concept of EIC is to embed one or multiple interposer chips into the build-up dielectric layers in the laminated substrate. The process development of EIC structure is investigated in this paper. EIC technology not only can shrink an electronic package and system size but also provide a better electronic performance for high-bandwidth applications. EIC technology can be one of the potential solutions for 3D System-in-Package.
  • Keywords
    dielectric waveguides; electronics packaging; semiconductor technology; system-in-package; three-dimensional integrated circuits; 3D system in package; 3DIC integration; EIC structure; EIC technology; build-up dielectric layers; design rules; device TSV process; electronic package; embedded interposer carrier technology; high density interconnection; innovative embedded interposer carrier; laminate carrier substrate; laminated substrate; multiple interposer chips; semiconductor technology; silicon interposer; Films; Laminates; Passivation; Silicon; Substrates; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2013 IEEE 63rd
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4799-0233-0
  • Type

    conf

  • DOI
    10.1109/ECTC.2013.6575745
  • Filename
    6575745