Optical characteristics of defect microstructure fiber using plane wave expansion method

Birefringence property and chromatic dispersion loss of microstructure fiber having defect at centre is thoroughly investigated in this paper. To obtain such properties, simulations are made for finding the modal field distribution of the same microstructure fiber using plane wave expansion (PWE) method. Simulation results reveal that birefringence property of aluminum-silicon, silver-silicon, and silicon dioxide-silicon microstructure fiber varies linearly with respect to wavelength, but it varies non linearly with respect to `r/a´ at different wavelengths. At last simulations are made to analyze the chromatic dispersion loss for the aforesaid microstructure fiber.