• DocumentCode
    628852
  • Title

    A CMOS 0.13μm read-out front-end for Triple-Gas-Electron-Multiplier detectors

  • Author

    Pezzotta, A. ; Costantini, A. ; De Blasi, M. ; De Matteis, M. ; Gorini, G. ; Murtas, F. ; Baschirotto, A.

  • Author_Institution
    Dept. of Phys., Univ. of Milano-Bicocca, Milano, Italy
  • fYear
    2013
  • fDate
    13-14 June 2013
  • Firstpage
    65
  • Lastpage
    70
  • Abstract
    In this paper a dedicated integrated front-end for the Triple-GEM (Gas Electron Multiplier) detector is presented. The design has been realized in 0.13 μm CMOS technology. This system aims to improve performance with respect to the state-of-the-art on these types of detectors, regarding adaptability, portability, power consumption and on-chip data processing. The front-end is composed by 8-input-channels. Each channel performs the charge-vs-time conversion, and then the signal is definitively converted into digital domain. For this aim a Charge-Sensitive Preamplifier (CSP), and a Charge-to-Time Converter (CTC) are implemented. An automatic on-chip calibration circuit is also included, in order to compensate CMOS technological process/temperature variations. The system is able to manage a 15 pF detector capacitance. The maximum count rate is 4·106 counts-per-second (cps) and the power consumption is 3.8 mW/ch. The Equivalent Noise Charge (ENC) is 418 e-. The front-end compares favorably with the state-of-the-art.
  • Keywords
    CMOS integrated circuits; electron multiplier detectors; readout electronics; CMOS technology; capacitance 15 pF; charge sensitive preamplifier; charge-time converter; detector capacitance; equivalent noise charge; read out electronic; size 0.13 mum; triple gas electron multiplier detector; CMOS integrated circuits; Calibration; Capacitance; Capacitors; Clocks; Detectors; Switches; CMOS; GEM detector; front-end; low-power; preamplifier; read-out;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Sensors and Interfaces (IWASI), 2013 5th IEEE International Workshop on
  • Conference_Location
    Bari
  • Print_ISBN
    978-1-4799-0039-8
  • Type

    conf

  • DOI
    10.1109/IWASI.2013.6576054
  • Filename
    6576054