DocumentCode
629567
Title
Error analysis of rectangular waveguide probe with finite flange for nondestructive EM-properties and thickness measurement
Author
Hasan, Abdulkadhum A.
Author_Institution
Dept. of Electron. & Commun. Eng., Kufa Univ., Najaf, Iraq
fYear
2013
fDate
19-21 June 2013
Firstpage
1
Lastpage
4
Abstract
In this work, open-ended waveguide probe is studied using Finite Difference Time-Domain (FDTD) technique to investigate the influence of ground-plane size on the input reflection coefficient of the probe. Variations in the ground-plane size for different materials and frequencies are simulated. In comparison with the analytical model results, it is found that using of waveguide probe with finite flange affects the input reflection coefficient substantially in some cases. Simulation results have shown that the consideration of ground-plane is large enough for the practical purpose to be infinite is restricted by the constitutive parameters and thickness of the material under test as well as the operating frequency. The FDTD simulations and experiments results are presented.
Keywords
electromagnetic wave reflection; error analysis; finite difference time-domain analysis; flanges; measurement errors; nondestructive testing; rectangular waveguides; thickness measurement; FDTD analysis; error analysis; finite difference time domain; finite flange; ground plane size variation; material under test; nondestructive EM-property; open ended rectangular waveguide probe; reflection coefficient; thickness measurement; Electromagnetic waveguides; Finite difference methods; Flanges; Materials; Probes; Reflection coefficient; Time-domain analysis; EM properties; FDTD; complex permittivity and permeability; numerical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Innovations in Intelligent Systems and Applications (INISTA), 2013 IEEE International Symposium on
Conference_Location
Albena
Print_ISBN
978-1-4799-0659-8
Type
conf
DOI
10.1109/INISTA.2013.6577662
Filename
6577662
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