DocumentCode
629680
Title
Analysis on temperature coefficient of a low-voltage current mirror
Author
Wada, Kazuyoshi ; Takano, Masatoshi ; Sekine, Keisuke
Author_Institution
Dept. of Electron. & Bioinf., Meiji Univ., Kawasaki, Japan
fYear
2013
fDate
20-21 June 2013
Firstpage
1
Lastpage
4
Abstract
The current mirror where the bulk terminal of each MOSFET is connected with itself gate terminal for low-voltage operation is investigated from the view point of temperature characteristic. Temperature coefficient is analyzed and it is clarified that the low-voltage current mirror can have small sensitivity with respect to the temperature.
Keywords
MOSFET; mirrors; MOSFET; gate terminal; low-voltage current mirror; low-voltage operation; temperature coefficient; Logic gates; MOSFET; Mathematical model; Mirrors; Temperature distribution; Temperature sensors; bulk terminal; current mirror; temperature coefficient; weak inversion region;
fLanguage
English
Publisher
ieee
Conference_Titel
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location
Paris
Print_ISBN
978-1-4673-6105-7
Type
conf
DOI
10.1109/FTFC.2013.6577777
Filename
6577777
Link To Document