DocumentCode
629682
Title
Compact modeling solutions for OxRAM memories
Author
Bocquet, Michael ; Deleruyelle, D. ; Aziza, H. ; Muller, Candice ; Portal, J.-M.
Author_Institution
IM2NP, Aix-Marseille Univ., Marseille, France
fYear
2013
fDate
20-21 June 2013
Firstpage
1
Lastpage
4
Abstract
Emerging non-volatile memories based on resistive switching mechanisms pull intense R&D efforts from both academia and industry. Oxide-based Resistive Random Acces Memories (namely OxRAM) gather noteworthy performances, such as fast write/read speed, low power and high endurance outperforming therefore conventional Flash memories. To fully explore new design concepts such as distributed memory in logic, OxRAM compact models have to be developed and implemented into electrical simulators to assess performances at a circuit level. In this paper, we present an compact models of the bipolar OxRAM memory based on physical phenomenons. This model was implemented in electrical simulators for single device up to circuit level.
Keywords
bipolar memory circuits; circuit simulation; integrated circuit design; integrated circuit modelling; random-access storage; R&D; bipolar OxRAM memory; compact modeling solution; distributed memory in logic; electrical simulator; flash memory; nonvolatile memory; oxide-based resistive random access memory; resistive switching mechanism; Hafnium compounds; Integrated circuit modeling; Mathematical model; Nonvolatile memory; Random access memory; Resistance; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location
Paris
Print_ISBN
978-1-4673-6105-7
Type
conf
DOI
10.1109/FTFC.2013.6577779
Filename
6577779
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