• DocumentCode
    629682
  • Title

    Compact modeling solutions for OxRAM memories

  • Author

    Bocquet, Michael ; Deleruyelle, D. ; Aziza, H. ; Muller, Candice ; Portal, J.-M.

  • Author_Institution
    IM2NP, Aix-Marseille Univ., Marseille, France
  • fYear
    2013
  • fDate
    20-21 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Emerging non-volatile memories based on resistive switching mechanisms pull intense R&D efforts from both academia and industry. Oxide-based Resistive Random Acces Memories (namely OxRAM) gather noteworthy performances, such as fast write/read speed, low power and high endurance outperforming therefore conventional Flash memories. To fully explore new design concepts such as distributed memory in logic, OxRAM compact models have to be developed and implemented into electrical simulators to assess performances at a circuit level. In this paper, we present an compact models of the bipolar OxRAM memory based on physical phenomenons. This model was implemented in electrical simulators for single device up to circuit level.
  • Keywords
    bipolar memory circuits; circuit simulation; integrated circuit design; integrated circuit modelling; random-access storage; R&D; bipolar OxRAM memory; compact modeling solution; distributed memory in logic; electrical simulator; flash memory; nonvolatile memory; oxide-based resistive random access memory; resistive switching mechanism; Hafnium compounds; Integrated circuit modeling; Mathematical model; Nonvolatile memory; Random access memory; Resistance; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Faible Tension Faible Consommation (FTFC), 2013 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-6105-7
  • Type

    conf

  • DOI
    10.1109/FTFC.2013.6577779
  • Filename
    6577779