DocumentCode
629684
Title
Energy limits in A/D converters
Author
Murmann, Boris
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear
2013
fDate
20-21 June 2013
Firstpage
1
Lastpage
4
Abstract
Driven by ever-increasing application demands, the energy expended per A/D conversion has improved substantially over the last decade. This paper surveys the most recent trends and investigates practical energy limits of A/D converter architectures that are commonly employed in fine-line CMOS technology. We observe that today´s most efficient converters operate at about two orders of magnitude above the classical 8kT·SNR thermal limit. Furthermore, it is shown that a large fraction of today´s designs have approached ideal thermal limit lines, corresponding to a four-fold increase in energy per bit of resolution.
Keywords
CMOS digital integrated circuits; analogue-digital conversion; A/D conversion; A/D converters; application demands; energy limits; fine-line CMOS technology; ideal thermal limit lines; Analog-digital conversion; CMOS integrated circuits; Energy resolution; Market research; Noise; Power dissipation; Thermal noise; CMOS; analog-to-digital converters; energy limits;
fLanguage
English
Publisher
ieee
Conference_Titel
Faible Tension Faible Consommation (FTFC), 2013 IEEE
Conference_Location
Paris
Print_ISBN
978-1-4673-6105-7
Type
conf
DOI
10.1109/FTFC.2013.6577781
Filename
6577781
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