A +0.4°C accurate high-speed remote junction temperature sensor with digital Beta correction and series-resistance cancellation in 65nm CMOS

Author

Xiao Pu ; Ash, Matthew ; Nagaraj, Kanthi ; Park, Jongho ; Vu, Steve ; Kimelman, Paul ; de la Haye, Sean

Author_Institution

Texas Instrum., Dallas, TX, USA

fYear

2013

fDate

12-14 June 2013

Abstract

A true remote junction temperature sensor (RTS) with 3σ accuracy of 0.4 degrees over a temperature range of -40 to 130 degrees is presented. Using a novel digital beta compensation technique and series resistance cancellation (SRC), the sensor is capable of handling parasitic BJTs buried in other SoCs on a PCB located at large distances. The IC is manufactured in a 65nm digital CMOS process.

Keywords

CMOS digital integrated circuits; bipolar transistors; delta-sigma modulation; printed circuits; series (mathematics); system-on-chip; temperature sensors; PCB; RTS; SRC; SoC; digital Beta correction; digital CMOS process; digital beta compensation technique; high-speed remote junction temperature sensor; parasitic BJT; series resistance cancellation; series-resistance cancellation; size 65 nm; temperature range; Accuracy; CMOS integrated circuits; Current density; Resistance; System-on-chip; Temperature measurement; Temperature sensors; Beta correction; Temperature sensor; delta sigma modulator;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits (VLSIC), 2013 Symposium on

Conference_Location

Kyoto

Print_ISBN

978-1-4673-5531-5

Type

conf

Filename

6578667