• DocumentCode
    630050
  • Title

    A neurochemical pattern generator SoC with switched-electrode management for single-chip electrical stimulation and 9.3µW, 78pArms, 400V/s FSCV sensing

  • Author

    Bozorgzadeh, Bardia ; Covey, Daniel P. ; Howard, Christopher D. ; Garris, Paul A. ; Mohseni, Pedram

  • Author_Institution
    EECS Dept., Case Western Reserve Univ., Cleveland, OH, USA
  • fYear
    2013
  • fDate
    12-14 June 2013
  • Abstract
    This paper describes a system-on-chip (SoC) fabricated in 0.35μm 2P/4M CMOS for high-fidelity neurochemical pattern generation in vivo. The SoC uniquely integrates electrical stimulation with embedded timing management and 400V/s fast-scan cyclic voltammetry (FSCV) sensing, and manages a novel switched-electrode scheme that eliminates the possibility of large stimulus artifacts adversely affecting electrochemistry. The SoC also leverages the discontinuous sampling inherent in FSCV to reduce the power consumption per sensing channel by ~88% vs. state-of-the-art. The correlation coefficient between the predicted and measured temporal profiles of electrically evoked dopamine in the brain of an anesthetized rat is 0.95.
  • Keywords
    CMOS digital integrated circuits; biological techniques; system-on-chip; voltammetry (chemical analysis); CMOS fabrication; FSCV sensing; correlation coefficient; current 78 pA; electrical stimulation; electrically-evoked dopamine; electrochemistry; embedded timing management; fast-scan cyclic voltammetry sensing; high-fidelity neurochemical pattern generation; neurochemical pattern generator SoC; power 9.3 muW; power consumption reduction; single-chip electrical stimulation; size 0.35 mum; switched-electrode management; system-on-chip; Computer architecture; Current measurement; Electrical stimulation; Power capacitors; Sensors; System-on-chip; Timing; fast-scan cyclic voltammetry; neurochemical sensing; neuromodulation; pattern generation; system-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSIC), 2013 Symposium on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-5531-5
  • Type

    conf

  • Filename
    6578715