DocumentCode
6328
Title
Electrical Injection Schemes for Nanolasers
Author
Lupi, A. ; Il-Sug Chung ; Yvind, Kresten
Author_Institution
Dept. of Photonics Eng., Tech. Univ. of Denmark, Lyngby, Denmark
Volume
26
Issue
4
fYear
2014
fDate
Feb.15, 2014
Firstpage
330
Lastpage
333
Abstract
Three electrical injection schemes based on recently demonstrated electrically pumped photonic crystal nanolasers have been numerically investigated: 1) a vertical p-i-n junction through a post structure; 2) a lateral p-i-n junction with a homostructure; and 3) a lateral p-i-n junction with a buried heterostructure. Self-consistent laser-diode simulations reveal that the lateral injection scheme with a buried heterostructure achieves the best lasing characteristics at a low current, whereas the vertical injection scheme performs better at a higher current for the chosen geometries. For this analysis, the properties of different schemes, i.e., electrical resistance, threshold voltage, threshold current, and internal efficiency as energy requirements for optical interconnects are compared and the physics behind the differences is discussed.
Keywords
electrical resistivity; nanophotonics; numerical analysis; optical interconnections; p-i-n diodes; photonic crystals; semiconductor lasers; electrical injection schemes; electrical resistance properties; electrically pumped photonic crystal nanolasers; internal efficiency properties; lasing characteristics; lateral injection scheme; lateral p-i-n junction; numerical investigation; optical interconnects; self-consistent laser-diode simulations; threshold current properties; threshold voltage properties; vertical p-i-n junction; Leakage currents; Materials; Optical interconnections; Semiconductor lasers; Spontaneous emission; Threshold current; Current injection; electrically pumped; low threshold nanolaser; optical interconnects;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2293511
Filename
6678187
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