• DocumentCode
    6328
  • Title

    Electrical Injection Schemes for Nanolasers

  • Author

    Lupi, A. ; Il-Sug Chung ; Yvind, Kresten

  • Author_Institution
    Dept. of Photonics Eng., Tech. Univ. of Denmark, Lyngby, Denmark
  • Volume
    26
  • Issue
    4
  • fYear
    2014
  • fDate
    Feb.15, 2014
  • Firstpage
    330
  • Lastpage
    333
  • Abstract
    Three electrical injection schemes based on recently demonstrated electrically pumped photonic crystal nanolasers have been numerically investigated: 1) a vertical p-i-n junction through a post structure; 2) a lateral p-i-n junction with a homostructure; and 3) a lateral p-i-n junction with a buried heterostructure. Self-consistent laser-diode simulations reveal that the lateral injection scheme with a buried heterostructure achieves the best lasing characteristics at a low current, whereas the vertical injection scheme performs better at a higher current for the chosen geometries. For this analysis, the properties of different schemes, i.e., electrical resistance, threshold voltage, threshold current, and internal efficiency as energy requirements for optical interconnects are compared and the physics behind the differences is discussed.
  • Keywords
    electrical resistivity; nanophotonics; numerical analysis; optical interconnections; p-i-n diodes; photonic crystals; semiconductor lasers; electrical injection schemes; electrical resistance properties; electrically pumped photonic crystal nanolasers; internal efficiency properties; lasing characteristics; lateral injection scheme; lateral p-i-n junction; numerical investigation; optical interconnects; self-consistent laser-diode simulations; threshold current properties; threshold voltage properties; vertical p-i-n junction; Leakage currents; Materials; Optical interconnections; Semiconductor lasers; Spontaneous emission; Threshold current; Current injection; electrically pumped; low threshold nanolaser; optical interconnects;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2013.2293511
  • Filename
    6678187