DocumentCode
633897
Title
Research on tin whisker growth of pure tin plating of different lead substrates
Author
Zhou Bin ; Wan Zhonghua ; Li Xunping ; En Yun-Fei
Author_Institution
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., CEPREI, Guangzhou, China
fYear
2013
fDate
15-19 July 2013
Firstpage
611
Lastpage
614
Abstract
To study the tin whisker growth behavior of different lead substrates, five kinds of lead frames were designed as plating substrates and the pure tin were electroplated onto the substrates respectively, then the thermal shock, high temperature/humidity storage, and the ambient temperature/humidity storage test were performed under the annealing and un-annealing conditions, and the effect of lead substrates on the crystal structures of Sn plating was analyzed and the influence of environment condition, crystal structure, annealing process on the tin whisker growth was studied. The results showed that the Sn plating of brass frame was easier to grow tin whisker than other lead frames because of bigger crystal sizes and smaller boundary interspaces of grains, The temperature change condition was the best external driving force, The capability of anti-tin whisker was excellent for Sn plating of C7025 substrate plating, and the external environment had a great impact to the tin whisker growth of 42 alloy substrate plating. At last, the annealing process was available to slow down the growth of tin whisker under isothermal condition.
Keywords
annealing; brass; electroplating; lead; tin; whiskers (crystal); C7025 substrate plating; Pb; alloy substrate plating; ambient temperature-humidity storage test; annealing condition; annealing process; antitin whisker; boundary grain interspace; brass frame; crystal sizes; crystal structure; electroplating; environment condition; high-temperature-humidity storage; isothermal condition; lead frames; lead substrates; plating substrates; pure tin plating; temperature change condition; thermal shock; tin whisker growth behavior; un-annealing condition; Annealing; Electric shock; Lead; Reliability engineering; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
Conference_Location
Suzhou
ISSN
1946-1542
Print_ISBN
978-1-4799-1241-4
Type
conf
DOI
10.1109/IPFA.2013.6599235
Filename
6599235
Link To Document