• DocumentCode
    633915
  • Title

    Failure analysis for via with solder bubble

  • Author

    Wang Yang ; Luo Daojun

  • Author_Institution
    Reliability Res. & Anal. Center, China CEPREI Lab., Guangzhou, China
  • fYear
    2013
  • fDate
    15-19 July 2013
  • Firstpage
    770
  • Lastpage
    773
  • Abstract
    A failure PCBA sample with solder bubble problem and a bare PCB sample were analyzed with the aid of stereomicroscope and SEM and cross sections, Thermal stress test and solderability test were performed on the failure PCBA sample and the bare PCB sample. The cause of vias with solder bubbles in failure PCBA sample was found after systematic analysis, the failure was caused by the residual moisture or flux permeating inside the defects in barrel plating and dielectric material surrounding the hole venting and blasting out during high-temperature soldering. The defects around the vias should be induced by the improper drilling process. To achieve good drilling quality and avoiding the solder bubbles problem, drilling materials, drill thrust, quality of surface of vias and proper drilling equipment should be well selected and controlled.
  • Keywords
    dielectric materials; drilling; failure analysis; moisture; printed circuit testing; printed circuits; scanning electron microscopy; solders; SEM; bare PCB sample; barrel plating; dielectric material; drill thrust; drilling equipment; drilling materials; drilling process; failure PCBA sample; failure analysis; flux permeation; high-temperature soldering; residual moisture; solder bubble problem; solderability test; stereomicroscope; surface quality; thermal stress test; Electronics packaging; Reliability; PCBA; SEM; Solder bubbles; cross section; failure; via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the
  • Conference_Location
    Suzhou
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4799-1241-4
  • Type

    conf

  • DOI
    10.1109/IPFA.2013.6599274
  • Filename
    6599274