• DocumentCode
    637618
  • Title

    Unified charge model for short-channel junctionless double gate MOSFETs

  • Author

    Holtij, Thomas ; Graef, Michael ; Hain, Fabian ; Kloes, Alexander ; Iniguez, B.

  • Author_Institution
    Competence Center for Nanotechnol. & Photonics, Tech. Hochschule Mittelhessen, Giessen, Germany
  • fYear
    2013
  • fDate
    20-22 June 2013
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    A 2D physics-based model for short-channel junctionless double gate (DG) MOSFETs is presented. From a closed-form solution for the 2D potential we derive explicit equations for the calculation of threshold voltage VT and subthreshold slope S. A unified charge model valid for all operating regimes is developed by using Lambert´s W-function, and a standard smoothing function for the transition between depletion and accumulation region. The model for the potential is derived with the help of Poisson´s equation and the conformal mapping technique by Schwarz-Christoffel. Dependencies between the physical device parameters and their impact on the device performance are worked out. A comparison of our 2D physics-based model is done versus 2D TCAD Sentaurus simulation data.
  • Keywords
    MOSFET; Poisson equation; conformal mapping; electric charge; function approximation; 2D TCAD Sentaurus simulation data; 2D physics-based model; Lambert´s W-function; Poisson´s equation; Schwarz-Christoffel; accumulation region; closed-form solution; conformal mapping technique; depletion region; device performance; physical device parameters; short-channel junctionless double gate MOSFET; standard smoothing function; subthreshold slope; threshold voltage; unified charge model; Doping; Electric potential; Equations; Logic gates; Mathematical model; Semiconductor process modeling; Threshold voltage; 2D analytical modeling; Junctionless double gate MOSFET; conformal mapping; subthreshold slope; threshold voltage; unified charge model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits and Systems (MIXDES), 2013 Proceedings of the 20th International Conference
  • Conference_Location
    Gdynia
  • Print_ISBN
    978-83-63578-00-8
  • Type

    conf

  • Filename
    6613316