DocumentCode
644706
Title
Characterization of encapsulation and metal interconnects of solar cells by terahertz techniques
Author
Minkevicius, L. ; Urbanowicz, A. ; Krotkus, A. ; Setkus, A. ; Tamosiunas, V.
Author_Institution
Center for Phys. Sci. & Technol., Vilnius, Lithuania
fYear
2013
fDate
1-6 Sept. 2013
Firstpage
1
Lastpage
2
Abstract
We present our investigations of solar cell mini modules and metal interconnects using terahertz time-domain spectroscopic imaging. It was demonstrated, that time-domain data can be used to reveal the thickness variation of encapsulating layers and height difference of metal contact surfaces in a vicinity of shunts.
Keywords
encapsulation; interconnections; solar cells; terahertz wave spectra; time-domain analysis; encapsulating layers; encapsulation characterization; height difference; metal contact surfaces; metal interconnect characterization; shunt vicinity; solar cell minimodules; terahertz techniques; terahertz time-domain spectroscopic imaging; thickness variation; time-domain data; Encapsulation; Imaging; Laser beams; Laser excitation; Metals; Photovoltaic cells; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013 38th International Conference on
Conference_Location
Mainz
Type
conf
DOI
10.1109/IRMMW-THz.2013.6665675
Filename
6665675
Link To Document