• DocumentCode
    64556
  • Title

    Photometric Stereo Using Sparse Bayesian Regression for General Diffuse Surfaces

  • Author

    Ikehata, Satoshi ; Wipf, David ; Matsushita, Yuki ; Aizawa, K.

  • Author_Institution
    Dept. of Inf. Sci. & Technol., Univ. of Tokyo, Tokyo, Japan
  • Volume
    36
  • Issue
    9
  • fYear
    2014
  • fDate
    Sept. 2014
  • Firstpage
    1816
  • Lastpage
    1831
  • Abstract
    Most conventional algorithms for non-Lambertian photometric stereo can be partitioned into two categories. The first category is built upon stable outlier rejection techniques while assuming a dense Lambertian structure for the inliers, and thus performance degrades when general diffuse regions are present. The second utilizes complex reflectance representations and non-linear optimization over pixels to handle non-Lambertian surfaces, but does not explicitly account for shadows or other forms of corrupting outliers. In this paper, we present a purely pixel-wise photometric stereo method that stably and efficiently handles various non-Lambertian effects by assuming that appearances can be decomposed into a sparse, non-diffuse component (e.g., shadows, specularities, etc.) and a diffuse component represented by a monotonic function of the surface normal and lighting dot-product. This function is constructed using a piecewise linear approximation to the inverse diffuse model, leading to closed-form estimates of the surface normals and model parameters in the absence of non-diffuse corruptions. The latter are modeled as latent variables embedded within a hierarchical Bayesian model such that we may accurately compute the unknown surface normals while simultaneously separating diffuse from non-diffuse components. Extensive evaluations are performed that show state-of-the-art performance using both synthetic and real-world images.
  • Keywords
    belief networks; photometry; piecewise linear techniques; regression analysis; stereo image processing; complex reflectance representations; dense Lambertian structure; general diffuse surfaces; hierarchical Bayesian model; inverse diffuse model; nonlinear optimization; photometric stereo method; piecewise linear approximation; sparse Bayesian regression; stable outlier rejection techniques; Bayes methods; Computational modeling; Lighting; Materials; Mathematical model; Robustness; Vectors; Photometric stereo; piecewise linear regression; sparse bayesian learning; sparse regression;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2014.2299798
  • Filename
    6714613