DocumentCode
646655
Title
Full-wave modeling of inductive coupling links for low-power 3D system integration
Author
Vali, T. ; Marotta, G. ; De Santis, Luca ; Antonini, Giulio ; Romano, Daniela ; De Luca, Giuseppe F.
Author_Institution
Micron Semicond. Italia S.r.l., Avezzano, Italy
fYear
2013
fDate
5-9 Aug. 2013
Firstpage
17
Lastpage
21
Abstract
In recent years, 3D system integration has emerged as a new paradigm to reduce the overall size of multichip systems (processor and memory stacks), improve data throughput, and lower assembly costs. Among the various techniques developed to connect multiple die in a 3D integrated-circuit (IC) package, inductive coupling links are very cost-effective solutions that require no specialized processing steps. While it is easy to use integrated inductors to implement inductive coupling links in standard CMOS processes, evaluating their electrical characteristics requires using an electromagnetic field solver software. And, integrating these links into a standard SPICE-like circuit design environment is not straightforward. In this paper, we describe a technique, based on the partial element equivalent circuit (PEEC) method, to model an integrated inductive coupling link as a simple lumped parameter circuit. Starting from layout and technology data, the lumped parameter circuit model can be used in a SPICE-like simulator for system design purposes.
Keywords
CMOS integrated circuits; equivalent circuits; integrated circuit modelling; integrated circuit packaging; low-power electronics; multichip modules; three-dimensional integrated circuits; 3D integrated-circuit package; CMOS processes; IC package; PEEC method; SPICE-like circuit design environment; assembly costs; data throughput; electrical characteristics; electromagnetic field solver software; full-wave modeling; inductive coupling links; low-power 3D system integration; lumped parameter circuit model; memory stacks; multichip systems; multiple die; partial element equivalent circuit method; system design; Coils; Couplings; Integrated circuit modeling; Mathematical model; Solid modeling; Three-dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2013 IEEE International Symposium on
Conference_Location
Denver, CO
ISSN
2158-110X
Print_ISBN
978-1-4799-0408-2
Type
conf
DOI
10.1109/ISEMC.2013.6670374
Filename
6670374
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