• DocumentCode
    649551
  • Title

    Thermal design of a high current circuit board for automotive applications

  • Author

    Mrossko, R. ; Neeb, Christoph ; Hofmann, T. ; Neumann, Axel ; Keller, James

  • Author_Institution
    AMIC GmbH, Berlin, Germany
  • fYear
    2013
  • fDate
    25-27 Sept. 2013
  • Firstpage
    206
  • Lastpage
    209
  • Abstract
    The demand of cost reduction and limited installation space for automotive applications requires new and innovative approaches. One approach is to substitute DCB substrates with high current circuit boards. These circuit boards with fully embedded actives like IGBTs and Diodes allows to avoid the use of bonding wires at all and benefit from the less expensive standard circuit board technologies. Moreover it should be possible to use double sided cooling for such devices. In this paper we investigate the influence of several geometry and material parameter, like layer thicknesses, thermal conductivity and cooling power on the thermal performance of a fully embedded 650V class half bridge test board. As input for the simulations the thermal conductivity of prepreg materials were measured. It could be shown that layer thicknesses have a significant impact of the necessary cooling power. The embedding of chips directly into laminated substrates seems reliable regarding thermal loading. Further results will be obtained by thermal measurements.
  • Keywords
    automotive electronics; cooling; insulated gate bipolar transistors; thermal conductivity; DCB substrates; IGBT; automotive application; bonding wires; cooling power; cost reduction demand; diodes; double-sided cooling; fully-embedded actives; fully-embedded half-bridge test board; high-current circuit board; high-current circuit boards; laminated substrates; layer thickness; limited installation space; material parameter; prepreg materials; standard circuit board technology; thermal conductivity; thermal design; thermal loading; thermal measurement; voltage 650 V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2013 19th International Workshop on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4799-2271-0
  • Type

    conf

  • DOI
    10.1109/THERMINIC.2013.6675245
  • Filename
    6675245