• DocumentCode
    653467
  • Title

    A New Infrared Sensor Model Based on Imaging System Test Parameter

  • Author

    Liu Zheng ; Mao Hongxia ; Dai Ying-hong ; Wu Jingli

  • fYear
    2013
  • fDate
    20-23 Aug. 2013
  • Firstpage
    1953
  • Lastpage
    1956
  • Abstract
    This article presents an infrared sensor model based on test parameters. From standard geometrical planes infrared frames, some sensor parameters can be measured, such as SiTF, MTF, and noise. With the above parameters and some other characteristics, a sensor model is developed. The sensor model is validated through a point target test and a four-bar target test, and the error is below 5%.This model is unlike traditional models in that it does not need a series of parameters which a sensor user can not achieve, and it also has acceptable precision. This model shows a great convenience in scene simulation and scene analysis.
  • Keywords
    image sampling; infrared detectors; infrared imaging; noise measurement; optical transfer function; MTF; SiTF; four-bar target test; geometrical planes; imaging system test parameter; infrared frames; infrared sensor model; noise measurement; point target test; scene analysis; scene simulation; Analytical models; Computational modeling; Detectors; Infrared sensors; Noise; Noise measurement; Temperature measurement; sensor measurement; sensor model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Green Computing and Communications (GreenCom), 2013 IEEE and Internet of Things (iThings/CPSCom), IEEE International Conference on and IEEE Cyber, Physical and Social Computing
  • Conference_Location
    Beijing
  • Type

    conf

  • DOI
    10.1109/GreenCom-iThings-CPSCom.2013.364
  • Filename
    6682375