• DocumentCode
    655629
  • Title

    Device characterization for LTE applications with wideband baseband, fundamental and harmonic impedance control

  • Author

    Manjanna, A. Kumar ; Marchetti, Mirco ; Buisman, Koen ; Spirito, M. ; Pelk, M.J. ; de Vreede, Leo C. N.

  • Author_Institution
    Anteverta-mw B.V., Delft, Netherlands
  • fYear
    2013
  • fDate
    6-10 Oct. 2013
  • Firstpage
    255
  • Lastpage
    258
  • Abstract
    With this work we address the linearity characterization of active devices within an active load pull characterization setup. Realistic real-life circuit scenarios can be mimicked and adjusted without compromise or tradeoffs in favor of improved EVM and ACPR for communication standard compliant test signals like LTE advanced.
  • Keywords
    Long Term Evolution; harmonics suppression; ACPR; EVM; LTE advanced; Long Term Evolution; active load pull characterization setup; harmonic impedance control; wideband baseband impedance terminations; Baseband; Harmonic analysis; Impedance; Impedance measurement; Linearity; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2013 European
  • Conference_Location
    Nuremberg
  • Type

    conf

  • Filename
    6686639
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=655629