Stochastic EMI sources localization based on ultra wide band near-field measurements

Author

Baev, Andrey ; Gorbunova, Anastasia ; Konovalyuk, Maxim ; Kuznetsov, Yury ; Russer, Johannes A.

Author_Institution

Theor. Radio Eng. Dept., Aviation Inst. (Nat. Res. Univ.), Moscow, Russia

fYear

2013

fDate

6-10 Oct. 2013

Firstpage

1131

Lastpage

1134

Abstract

A localization technique for stochastic EMI sources based on time domain measurements of EM near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The main limitations for scanning parameters are discussed. The case study for a frequency and spatial localizations of equivalent point sources is presented based on the modeling and measurement results.

Keywords

electromagnetic interference; near-field communication; stochastic processes; time-domain analysis; ultra wideband communication; EM near-field tangential components; autocorrelation functions; crosscorrelation functions; frequency localizations; spatial localizations; stochastic EMI sources; stochastic field distribution; time domain measurements; two-point planar scanning system; ultrawideband near-field measurement; Correlation; Electromagnetic interference; Frequency-domain analysis; Magnetic field measurement; Stochastic processes; Time-domain analysis; near-field scanning; object plane; parametric identification; point sourse; stochastic field;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference (EuMC), 2013 European

Conference_Location

Nuremberg

Type

conf

Filename

6686861