• DocumentCode
    655915
  • Title

    Class-BJ power amplifier modes: The IMD behavior of reactive terminations

  • Author

    Carrubba, V. ; Maroldt, S. ; Quay, Ruediger ; Ambacher, Oliver

  • Author_Institution
    High Freq. Devices & Circuits, Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg, Germany
  • fYear
    2013
  • fDate
    6-10 Oct. 2013
  • Firstpage
    1391
  • Lastpage
    1394
  • Abstract
    For the first time a two-tone intermodulation distortion behavior for the class-BJ power amplifier mode is studied. The right phase combination of fundamental and second harmonic terminations lead to new output solutions where the power-efficiency is maintained optimum. However, no IMD behavior has so far been investigated for such terminations on a power transistor through load-pull investigation. In this paper, the class-BJ IMD analysis is investigated theoretically and experimentally through measurement activity on a 1.2 mm AlGaN/GaN power transistor under a two-tone excitation. The measurement results show that the standard class-B and reactive class-BJ solutions deliver same power-efficiency as well as same IM3 performance when driving the device into compression. However, when driving the device at 6 dB input power back-off, despite power and efficiency are similar with varying the terminations, the standard class-B state reveals better IM3 values of -40.5 dBc compared with the class-BJ solution of -31.8 dBc.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; intermodulation distortion; power amplifiers; wide band gap semiconductors; AlGaN-GaN; IMD behavior; class-BJ IMD analysis; class-BJ power amplifier modes; fundamental harmonic terminations; load-pull investigation; phase combination; power transistor; power-efficiency; reactive terminations; second harmonic terminations; size 1.2 mm; two-tone excitation; two-tone intermodulation distortion behavior; Harmonic analysis; Performance evaluation; Power amplifiers; Power generation; Power measurement; Power transistors; Standards; Aluminum gallium nitride; broadband amplifiers; intermodulation distortion; linearity; power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2013 European
  • Conference_Location
    Nuremberg
  • Type

    conf

  • Filename
    6686926