DocumentCode
658520
Title
Tutorials [2 abstracts]
Author
Singh, Adit D. ; Chakrabarty, Krishnendu
Author_Institution
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
fYear
2013
fDate
18-21 Nov. 2013
Abstract
These tutorials discuss the following: Statistical Adaptive Test Methods Targeting “Zero Defect” IC Quality and Reliability; and Testing TSV-Based 3D Stacked ICs.
Keywords
integrated circuit reliability; integrated circuit testing; 3D stacked IC testing; TSV; statistical adaptive test method; zero defect IC quality; zero defect IC reliability; Computers; Conferences; Manufacturing; Testing; Three-dimensional displays; Tutorials;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2013 22nd Asian
Conference_Location
Jiaosi Township
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2013.6
Filename
6690600
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