• DocumentCode
    658534
  • Title

    Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements

  • Author

    Xian Wang ; Kenfack, Blanchard ; Silva, Enrico ; Chatterjee, Avhishek

  • fYear
    2013
  • fDate
    18-21 Nov. 2013
  • Firstpage
    56
  • Lastpage
    61
  • Abstract
    This paper proposes a novel test method for the line and load regulation specifications of switched mode power converters (SMPCs) using alternative safe measurements. These specifications are not tested for many power converters because they cause voltage spikes under full load conditions on the tester that can damage the converter circuitry. To prevent damage to the DUT during manufacturing test, we propose a modification of the power converter load during test application. Optimized low cost tests are applied to the converter under low load current conditions, allowing accurate prediction of the closed-loop load and line regulation specifications (that require high load current) from the modified test procedure without the possibility of any damage to the DUT. The test approach is facilitated by the use of two sensors that allow the line and load regulation specifications of the converter to be predicted accurately from the proposed alternative test measurements. Simulation data and measurements from a hardware prototype are used to demonstrate the viability of the proposed safe testing approach.
  • Keywords
    DC-DC power convertors; circuit testing; power supply quality; switched mode power supplies; DUT damage avoidance; SMPC; alternative safe measurements; buck converter test; built-in test; closed-loop load prediction; converter circuitry; line regulation specifications; load regulation specifications; manufacturing test; power converter load modification; switched-mode power converters; voltage spikes; Load modeling; Predictive models; Sensors; Standards; Switches; Testing; Transistors; Alternative testing; DfT; buck converter test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2013 22nd Asian
  • Conference_Location
    Jiaosi Township
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2013.63
  • Filename
    6690615