• DocumentCode
    658560
  • Title

    On the Generation of Compact Deterministic Test Sets for BIST Ready Designs

  • Author

    Kumar, Ajit ; Rajski, J. ; Reddy, S.M. ; Rinderknecht, Thomas

  • Author_Institution
    Dept. of ECE, Univ. of Iowa, Iowa City, IA, USA
  • fYear
    2013
  • fDate
    18-21 Nov. 2013
  • Firstpage
    201
  • Lastpage
    206
  • Abstract
    In this work we consider ATPG methods tailored to BIST ready designs to improve compression of external tests for such designs. Proposed ATPG reduces external test set sizes and test data volumes by 24% in comparison to that obtained by a state of the art commercial ATPG for BIST ready designs.
  • Keywords
    automatic test pattern generation; built-in self test; ATPG; BIST; automatic test pattern generation; built-in self test; test sets generation; Automatic test pattern generation; Built-in self-test; Circuit faults; Controllability; Logic gates; Random access memory; Test data compression; ATPG; BIST Ready Design; Test Compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2013 22nd Asian
  • Conference_Location
    Jiaosi Township
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2013.45
  • Filename
    6690641
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=658560