DocumentCode
658566
Title
Functional Test Generation at the RTL Using Swarm Intelligence and Bounded Model Checking
Author
Gent, Kelson ; Hsiao, Michael S.
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
fYear
2013
fDate
18-21 Nov. 2013
Firstpage
233
Lastpage
238
Abstract
Although stochastic search techniques have shown promise in test generation and design validation, they often fail when there is a specific, random-resistant sequence of vectors required to exercise a target. In order to combat this, deterministic techniques are added, resulting in a hybrid solution to maintain high speed of execution while improving metric performance. This paper presents a formal hybridization that combines a Register Transfer Level (RTL) stochastic swarm intelligence based test vector generation with the Verilator Verilog-to-C++ source-to-source compiler. Verilator generates a fast cycle accurate C++ simulation unit for Verilog descriptions and provides instrumentation for branch and toggle coverage metrics. This RTL model can also be used to generate a bounded model checking (BMC) instance. During the stochastic search, the bounded model checker is launched to expand the unexplored search frontier and aid in the navigation of narrow paths. Additionally, an inductive reach ability test is applied in order to eliminate unreachable branches from our search space. These additions have significantly improved branch coverage, reaching 100% in several ITC99 benchmarks. Additionally, compared to previous functional test generation methods, we achieve substantial speedup achieved with purely stochastic methods.
Keywords
C++ language; computability; formal verification; hardware description languages; program compilers; program testing; search problems; stochastic processes; swarm intelligence; BMC instance; C++ simulation unit; RTL model; Verilator Verilog-to-C++ source-to-source compiler; bounded model checking; branch-toggle coverage metrics; design validation; deterministic techniques; functional test generation methods; inductive reach ability test; random-resistant sequence; register transfer level; satisfiability modulo theory; stochastic search techniques; swarm intelligence; test vector generation; Algorithm design and analysis; Hardware design languages; Instruments; Integrated circuit modeling; Measurement; Stochastic processes; Vectors; ACO; ATPG; Ant Colony Optimization; BMC; Bounded Model Checking; Functional Test; RTL; Swarm Intelligence;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2013 22nd Asian
Conference_Location
Jiaosi Township
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2013.51
Filename
6690647
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