DocumentCode
658567
Title
Path Constraint Solving Based Test Generation for Hard-to-Reach States
Author
Yanhong Zhou ; Tiancheng Wang ; Tao Lv ; Huawei Li ; Xiaowei Li
Author_Institution
State Key Lab. of Comput. Archit., Inst. of Comput. Technol., Beijing, China
fYear
2013
fDate
18-21 Nov. 2013
Firstpage
239
Lastpage
244
Abstract
Test generation for hard-to-reach states has been one of the hardest tasks in functional verification. In this paper, we present PACOST, a PAth Constraint Solving based Test generation method which operates in an abstraction-guided simulation framework to cover hard-to-reach states. PACOST combines concrete simulation and symbolic simulation in a path constraint solver to generate a set of valid input vectors for exploring different simulation paths, followed by next state selection considering abstract distances. In addition, two backtracking strategies are proposed to alleviate the dead end problem and ensure fast converge to the target state. Experimental results show that PACOST is effective in covering hard-to-reach states.
Keywords
automatic test pattern generation; backtracking; circuit simulation; constraint handling; electronic engineering computing; formal verification; integrated circuit testing; PACOST; abstract distances; abstraction-guided simulation framework; backtracking strategies; concrete simulation; functional verification; hard-to-reach states; next state selection; path constraint solver; path constraint solving based test generation method; simulation paths; symbolic simulation; Abstracts; Analytical models; Concrete; Engines; Radiation detectors; Registers; Vectors; abstraction-guided simulation; functional test generation; hard-to-reach states; path constraint solving;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2013 22nd Asian
Conference_Location
Jiaosi Township
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2013.52
Filename
6690648
Link To Document