DocumentCode
662673
Title
A reliable and cost-effective assembly process for quick prototyping with GaN FETs and other flip-chip packages
Author
Jenkins, Luke L. ; Wilson, Christopher G. ; Moses, Justin D. ; Aggas, Jeffrey M. ; Dean, Robert N.
Author_Institution
Electr. & Comput. Eng. Dept., Auburn Univ., Auburn, AL, USA
fYear
2013
fDate
27-29 Oct. 2013
Firstpage
84
Lastpage
87
Abstract
As transistors rapidly move to smaller packages, reliable prototyping becomes increasingly difficult. Ideally, high accuracy placement machines are preferred for device placement but are not practical for low-volume production. Here, a novel manual assembly process is applied to the 400 μm pitch EPC GaN FETs that has resulted in near 100% yield and exceptional reliability. The process requires a soldering iron and a reflow oven. An X-Ray image is preferred to verify alignment, but a successful alternate method is also presented. This assembly process, which can be applied to other flip chip and chip-scale packaging, will save time and resources in the development of new products employing wide bandgap power devices like EPC GaN FETs, and it has delivered significantly greater yield than alternative published methods.
Keywords
III-V semiconductors; chip scale packaging; gallium compounds; power field effect transistors; semiconductor device packaging; semiconductor device reliability; wide band gap semiconductors; GaN; GaN FET; X-ray image; assembly process; chip-scale packaging; flip-chip packages; quick prototyping; reflow oven; reliability; soldering iron; wide bandgap power devices; yield; Assembly; Field effect transistors; Gallium nitride; Ovens; Reliability; Substrates; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Wide Bandgap Power Devices and Applications (WiPDA), 2013 IEEE Workshop on
Conference_Location
Columbus, OH
Type
conf
DOI
10.1109/WiPDA.2013.6695568
Filename
6695568
Link To Document